Chiayi, Taiwan

Yu-Ta Chen

This inventor holds 2 USPTO granted patents. Top assignee: National Chung Cheng University. Active years: 2019-2021.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Yu-Ta Chen. Retrieved from https://idiyas.com/inventor/yu-ta-chen-py1zs0am

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


% Patents Active = 100.0

Average Co-Inventor Count = 3.4

ph-index = 1

Forward Citations = 2(Granted Patents)


Company Filing History:


Years Active: 2019-2021

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2 patents (USPTO):Explore Patents

Title: Innovations by Yu-Ta Chen

Introduction

Yu-Ta Chen is a notable inventor based in Chiayi County, Taiwan. He has made significant contributions to the field of error measurement systems, particularly in relation to rotary axes and movable platforms. With a total of 2 patents, his work showcases innovative approaches to precision measurement.

Latest Patents

Yu-Ta Chen's latest patents include a "Multi-degree-of-freedom error measurement system for rotary axes and method thereof." This invention provides a comprehensive system for measuring various errors in rotary axes, utilizing multiple rays and reflectors to achieve accurate measurements. His second patent, "Method and apparatus for measuring errors of movable platform in multiple degrees of freedom," describes a system that employs a light-source module and optoelectronic sensing modules to calculate alignment and straightness errors of movable platforms.

Career Highlights

Yu-Ta Chen is affiliated with National Chung Cheng University, where he continues to advance research in measurement technologies. His work is characterized by a commitment to enhancing the accuracy and reliability of measurement systems.

Collaborations

Yu-Ta Chen has collaborated with notable colleagues, including Chien-Sheng Liu and Yu-Fan Pu, contributing to the advancement of innovative measurement solutions.

Conclusion

Yu-Ta Chen's contributions to the field of error measurement systems reflect his dedication to innovation and precision. His patents demonstrate a profound understanding of complex measurement challenges, positioning him as a key figure in this area of research.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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