The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 19, 2021
Filed:
Jun. 26, 2018
National Chung Cheng University, Chiayi County, TW;
National Chung Cheng University, Chiayi County, TW;
Abstract
The present invention provides a multi-degree-of-freedom error measurement system for rotary axes and the method thereof. By producing a first ray, a second ray, and a third ray, the multi-facet reflector and the axicon disposed on an axis average line can receive the first, the second, and the third rays, respectively, for producing a reflective ray, a refractive ray, a first emitted ray, and a second emitted ray. Thereby, errors of the axicon in a plurality of degrees of freedom caused by shift or vibration of the axis average line, such as the x-axis radial error, the y-axis radial error, the axial error, the x-axis tilt error, the tilt error for the y-axis, and the angular alignment error for rotation can be measured.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile