The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 10, 2019
Filed:
Mar. 24, 2017
National Chung Cheng University, Chiayi County, TW;
Chien-Sheng Liu, Chiayi County, TW;
Yu-Ta Chen, Chiayi County, TW;
Yu-Fan Pu, Chiayi County, TW;
Yong-Tai Luo, Chiayi County, TW;
National Chung Cheng University, Chiayi County, TW;
Abstract
The present invention relates to a method and an apparatus for measuring errors of a movable platform in multiple degrees of freedom. A light-source module disposed on a fixed platform emits light to a lens module disposed on a movable platform. The light is reflected to one or more optoelectronic sensing module on the fixed platform via the lenses of the lens module. Then a processing unit calculates an alignment error or/and one or more straightness error or/and one or more angle error of the movable platform according to the signal generated by the optoelectronic sensing module.