Sejong, South Korea

Young-sik Ghim

USPTO Granted Patents = 6 

Average Co-Inventor Count = 2.3

ph-index = 1

Forward Citations = 2(Granted Patents)


Company Filing History:


Years Active: 2019-2025

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6 patents (USPTO):Explore Patents

Title: Young-sik Ghim: Innovator in Measurement Technologies

Introduction

Young-sik Ghim is a prominent inventor based in Sejong, South Korea. He has made significant contributions to the field of measurement technologies, holding a total of 6 patents. His work focuses on improving measurement accuracy and analyzing complex structures.

Latest Patents

One of his latest patents is a calibration method for deflectometry, which enhances measurement accuracy. This method allows for easy and fast calibration of deflectometry used in measuring and analyzing the shape of measurement targets with freeform surfaces. The calibration step involves measuring the phase of the reference plane mirror, geometric position information among components, and phase offsets. This innovative approach enables swift and accurate computation of gradient components through a novel algorithm.

Another notable patent is a device and method for measuring the thickness and refractive index of multilayer thin films using angle-resolved spectral reflectometry. This apparatus and method can measure and analyze the thickness and refractive index of each layer in a multilayer structure. It utilizes s-polarized and p-polarized imaging of reflective light, which is acquired through an angle-resolved spectral imaging acquisition part.

Career Highlights

Young-sik Ghim has worked at the Korea Research Institute of Standards and Science, where he has contributed to various research projects. His expertise in measurement technologies has positioned him as a key figure in advancing the field.

Collaborations

He has collaborated with notable coworkers, including Hyug-gyo Rhee and The-mahn Nguyen, further enhancing his research and development efforts.

Conclusion

Young-sik Ghim's innovative work in measurement technologies has led to significant advancements in the field. His patents reflect a commitment to improving measurement accuracy and analyzing complex structures, making him a valuable contributor to the scientific community.

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