The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 18, 2025
Filed:
Jul. 14, 2023
Korea Research Institute of Standard and Science, Daejeon, KR;
KOREA RESEARCH INSTITUTE OF STANDARD AND SCIENCE, Daejeon, KR;
Abstract
The present disclosure relates to a method that enables easy and fast calibration of deflectometry for measuring and analyzing the shape of a measurement target with a freeform surface in which the phase of the reference plane mirror, the geometric position information among the components (screen, reference plane mirror, detector) and β from the phase offset are measured are calibrated in the calibration step before the shape measurement of the measurement object; the phase of the measurement target is measured; α is calibrated using β as a basis to compute the gradient components; and the X-direction phase (X-direction gradient component) and Y-direction phase (Y-direction gradient component) are swiftly and accurately computed through a novel algorithm.