Ibi-gun, Japan

Yoshiyuki Ido


Average Co-Inventor Count = 2.7

ph-index = 3

Forward Citations = 30(Granted Patents)


Location History:

  • Gifu, JP (2004 - 2005)
  • Ibi-gun, JP (2006 - 2013)

Company Filing History:


Years Active: 2004-2013

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5 patents (USPTO):Explore Patents

Title: **The Innovative Contributions of Yoshiyuki Ido**

Introduction

Yoshiyuki Ido, an accomplished inventor from Ibi-gun, Japan, has made significant strides in the realm of semiconductor testing technology. With five patents to his name, his work exemplifies innovation and precision in engineering solutions that enhance reliability evaluation processes in semiconductor devices.

Latest Patents

Among his latest contributions are inventions such as the reliability evaluation test apparatus, reliability evaluation test system, contactor, and a reliability evaluation test method. These inventions focus on an advanced reliability evaluation test apparatus that features a wafer storage section, which securely holds a wafer such that the electrode pads of numerous devices on the wafer establish complete electrical contact with the bumps of a contactor. This apparatus facilitates the transmission and reception of test signals to and from a measurement section, boasting a hermetic and heat-insulating structure. The inclusion of a pressure mechanism that presses the contactor and a heating mechanism that heats the wafer to predetermined high temperatures allows for the assessment of the reliability of interconnection films and insulating films formed on the semiconductor wafer under accelerated conditions.

Career Highlights

Yoshiyuki Ido has had a distinguished career with notable organizations, including Ibiden Company Limited and Tokyo Electron Limited. His experience in these companies has profoundly influenced his inventive pursuits, enabling the application of his skills in developing advanced reliability evaluation systems for the semiconductor industry.

Collaborations

Throughout his career, Ido has collaborated with skilled professionals such as Kiyoshi Takekoshi and Hisatomi Hosaka. These partnerships have furthered his innovations and contributed to a collaborative environment that fosters cutting-edge advancements in semiconductor technology.

Conclusion

Yoshiyuki Ido’s contributions to the field of semiconductor reliability testing underscore the importance of innovation in technology development. His patents not only illustrate his technical expertise but also his commitment to enhancing the reliability and performance of semiconductor devices through advanced evaluation methods. As the industry continues to evolve, inventors like Ido play a pivotal role in shaping its future.

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