This inventor holds 14 USPTO granted patents, primarily in Projection Technology. Top assignee: Canon Kabushiki Kaisha. Active years: 1980-2000.
IDiyas Innovation Intelligence. (2026). Inventor Profile: Yoshiya Matsui. Retrieved from https://idiyas.com/inventor/yoshiya-matsui
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
Calculating rank
% Patents Active = 100.0
Average Co-Inventor Count = 3.6
ph-index = 7
Forward Citations = 111(Granted Patents)
Location History:
- Kanagawa, JP (1980)
- Yokohama all of, JP (1985)
- Yokohama, JP (1981 - 2000)
Company Filing History:
Years Active: 1980-2000
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Areas of Expertise:
Aberration Correction
Astronomical Telescope
Fizeau Interference
Projection Apparatus
Compound Eye
Image Projector
Fourier Transform
Projection Device
Projecting Device
Optical Systems
Measuring Method
14 patents (USPTO):Explore Patents
Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
IDiyas Innovation Intelligence. (2026). Inventor Profile: Yoshiya Matsui. Retrieved from https://idiyas.com/inventor/yoshiya-matsui
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]