The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 14, 2000
Filed:
Feb. 19, 1997
Applicant:
Inventors:
Kunio Takeshi, Yokohama, JP;
Mikichi Ban, Miura, JP;
Yoshiya Matsui, Yokohama, JP;
Kyoji Nariai, Tokyo, JP;
Assignee:
Canon Kabushiki Kaisha, Tokyo, JP;
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G02B / ; G02B / ; G02B / ; G02B / ;
U.S. Cl.
CPC ...
359399 ; 359364 ; 359433 ; 359554 ; 359557 ; 359646 ; 359726 ; 359728 ;
Abstract
An aberration correction system having a first lens disposed at an object side; and a second lens disposed at an image side, wherein the first and second lenses have different dispersions (Abbe numbers) with respect to each other, the surface of the object side of the first lens and the surface of the image side of the second lens which is adjacent to the image have substantially common center of curvature and the first and second lenses rotate around the center of curvature.