The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 19, 1980

Filed:

Feb. 23, 1978
Applicant:
Inventors:

Yoshiya Matsui, Kanagawa, JP;

Setsuo Minami, Kanagawa, JP;

Shih Yamaguchi, Hiratsuka, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G02B / ; G02B / ;
U.S. Cl.
CPC ...
350215 ; 350217 ;
Abstract

The present invention includes asymmetrical Fourier transform lens systems for use in performing optical Fourier transforms. The present invention also treats the application of an aberration theory to the design of such lens systems. The aberration theory leads to the conclusion that the lens systems not always necessitate symmetrical configuration and to a provision of necessary conditions which the resulting lens systems should satisfy. One embodiment of the first subsystem comprises at least three lens components each of which is composed of at least two lens elements. In a complete optical Fourier transform lens system, the second subsystem of the same construction as that of the first subsystem is arranged in longitudinally inverted relation thereto.


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