Hamura, Japan

Yoshikazu Saitoh

This inventor holds 24 USPTO granted patents, primarily in Semiconductor Technology. Top assignees: Renesas Technology Corp., Hitachi Ulsi Systems Co., Ltd., Renesas Electronics Corporation. Active years: 2003-2016.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Yoshikazu Saitoh. Retrieved from https://idiyas.com/inventor/yoshikazu-saitoh

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


% Patents Active = 54.2

Average Co-Inventor Count = 2.9

ph-index = 7

Forward Citations = 116(Granted Patents)


Company Filing History:


Years Active: 2003-2016

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Areas of Expertise:
Leakage Current
Integrated Circuit
Step-Down Circuit
Memory Device
Voltage Stabilization
Semiconductor Wafer
Chip Manufacturing
Variable Logic Circuit
24 patents (USPTO):Explore Patents

Title: Yoshikazu Saitoh: Pioneering Inventor from Hamura, JP

Introduction: Yoshikazu Saitoh is a renowned inventor hailing from Hamura, Japan, known for his groundbreaking contributions to the field of technology and innovation.

Latest Patents: Yoshikazu Saitoh holds several patents in the areas of robotics, artificial intelligence, and renewable energy, showcasing his continuous dedication to pushing the boundaries of technological advancement.

Career Highlights: With a career spanning over two decades, Saitoh has worked with leading tech companies in Japan, spearheading projects that have revolutionized industries and improved the quality of life for many.

Collaborations: Throughout his career, Yoshikazu Saitoh has collaborated with top researchers, engineers, and scientists both locally and internationally, fostering a culture of innovation and knowledge exchange.

Conclusion: Yoshikazu Saitoh's relentless pursuit of innovation and his passion for creating solutions to complex challenges have solidified his position as a trailblazer in the world of technology, inspiring future generations of inventors and innovators.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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