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For the Inventor, By the Inventor

Hitachinaka, Japan

Yoshifumi Taniguchi

This inventor holds 24 USPTO granted patents and 7 EPO patents, primarily in Electron Microscopy. Top assignees: Hitachi-High-Technologies Corporation, Hitachi, Ltd., Hitachi-Science Systems, Ltd.. Active years: 1996-2020.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Yoshifumi Taniguchi. Retrieved from https://idiyas.com/inventor/yoshifumi-taniguchi

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

USPTO Granted Patents = 24

% Patents Active = 54.2

 

Average Co-Inventor Count = 2.8

ph-index = 7

Forward Citations = 126(Granted Patents)


Location History:

  • Ibaraki-ken, JP (1996)
  • Hitachinaka, JP (1996 - 2013)
  • Tokyo, JP (2017 - 2020)

Company Filing History:

goldMedal16 out of 2,874 
 
Hitachi-High-Technologies Corporation
 patents
silverMedal8 out of 42,731 
 
Hitachi, Ltd.
 patents
bronzeMedal1 out of 33 
 
Hitachi-Science Systems, Ltd.
 patents
where one patent can have more than one assignee

Years Active: 1996-2020

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Areas of Expertise:
Electron Microscope
Charged Particle Beam
Spectral Image
Sample Holder
Material Characterization
Element Distribution
Energy Filter
Transmission Electron Microscope
Imaging Method
Specimen Preparation
Physical Properties
24 patents (USPTO):Explore Patents
1. 10636621 - Charged particle beam device for moving an aperture having plurality of openings and sample observation method (2020-04-28),
2. 10535497 - Electron microscope and imaging method (2020-01-14),
3. 9679738 - Electron microscope (2017-06-13),
4. 9558910 - Sample holder for electron microscope (2017-01-31),
5. 8530858 - Transmission electron microscope apparatus comprising electron spectroscope, sample holder, sample stage, and method for acquiring spectral image (2013-09-10),
6. 8436301 - Transmission electron microscope having electron spectrometer (2013-05-07),
7. 8263936 - Transmission electron microscope having electron spectroscope (2012-09-11),
8. D636005 - Electron microscope (2011-04-12),
9. 7812310 - Charged particle beam apparatus and specimen holder (2010-10-12),
10. 7723682 - Transmission electron microscope provided with electronic spectroscope (2010-05-25),
11. 7622714 - Standard specimen for a charged particle beam apparatus, specimen preparation method thereof, and charged particle beam apparatus (2009-11-24),
12. 7385198 - Method and apparatus for measuring the physical properties of micro region (2008-06-10),
13. 7381968 - Charged particle beam apparatus and specimen holder (2008-06-03),
14. 7235784 - Transmission electron microscope and image observation method using it (2007-06-26),
15. 7022988 - Method and apparatus for measuring physical properties of micro region (2006-04-04),

Title: The Innovative Journey of Inventor Yoshifumi Taniguchi

Introduction: Yoshifumi Taniguchi is a renowned inventor hailing from Hitachinaka, Japan. His groundbreaking work in the field of technology has earned him a well-deserved reputation as a pioneer in innovation.

Latest Patents: Yoshifumi Taniguchi holds several patents in various technological advancements, showcasing his continuous dedication to pushing the boundaries of innovation.

Career Highlights: Throughout his illustrious career, Taniguchi has been instrumental in developing cutting-edge technologies that have revolutionized the industry. His contributions have significantly impacted the way we interact with technology on a daily basis.

Collaborations: Taniguchi has collaborated with leading tech companies and research institutions to further his innovative projects. His ability to work in multidisciplinary teams has led to the successful implementation of groundbreaking ideas.

Conclusion: Yoshifumi Taniguchi's passion for innovation and his relentless pursuit of technological advancement continue to inspire generations of inventors. His legacy as a visionary in the field of technology is cemented by his numerous patents and revolutionary contributions to the industry.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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