Yawei Wen

Title: The Innovative Contributions of Yawei Wen

Introduction

Yawei Wen is a prominent inventor based in Beijing, China. He has made significant contributions to the field of technology, particularly in the areas of defect detection and quality assessment. With a total of 8 patents to his name, Wen's work showcases his commitment to advancing technological solutions.

Latest Patents

Wen's latest patents include a "Method and device for detecting defect of meal box, server, and storage medium." This invention provides a comprehensive approach to identifying defects in meal boxes through image recognition and defect detection models. Another notable patent is the "Method for detecting display screen quality, apparatus, electronic device and storage medium." This method utilizes deep convolutional neural networks to assess the quality of display screens, ensuring high standards in production lines.

Career Highlights

Throughout his career, Yawei Wen has worked with notable companies, including Beijing Baidu Netcom Science and Technology Co., Ltd. His experience in these organizations has allowed him to develop and refine his innovative ideas, contributing to the advancement of technology in various sectors.

Collaborations

Wen has collaborated with talented individuals such as Jiabing Leng and Minghao Liu. These partnerships have fostered a creative environment that encourages the exchange of ideas and the development of groundbreaking technologies.

Conclusion

Yawei Wen's contributions to technology through his patents and collaborations highlight his role as an influential inventor. His work continues to impact the industry positively, paving the way for future innovations.