The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 04, 2022
Filed:
Nov. 14, 2019
Beijing Baidu Netcom Science and Technology Co., Ltd., Beijing, CN;
Yawei Wen, Beijing, CN;
Jiabing Leng, Beijing, CN;
Minghao Liu, Beijing, CN;
Jiangliang Guo, Beijing, CN;
Xu Li, Beijing, CN;
Beijing Baidu Netcom Science and Technology Co., Ltd., Beijing, CN;
Abstract
Embodiments of the present disclosure provides a method and apparatus for inspecting burrs of an electrode slice. The method may include: acquiring a to-be-inspected electrode slice image; and inputting the to-be-inspected electrode slice image into a pre-trained burr instance segmentation model to obtain inspection result for characterizing whether the electrode slice displayed in the to-be-inspected electrode slice image has burrs and contour of the burrs, where the burr instance segmentation model is used to characterize the corresponding relationship between the electrode slice image and the inspection result and contour information. The method may further include: and outputting, in response to the inspection result for characterizing that the electrode slice displayed in the to-be-inspected electrode slice image has burrs, prompt information for characterizing that the electrode slice displayed in the to-be-inspected electrode slice image has burrs.