The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 01, 2022

Filed:

Jul. 27, 2020
Applicant:

Beijing Baidu Netcom Science Technology Co., Ltd., Beijing, CN;

Inventors:

Yawei Wen, Beijing, CN;

Jiabing Leng, Beijing, CN;

Minghao Liu, Beijing, CN;

Yulin Xu, Beijing, CN;

Jiangliang Guo, Beijing, CN;

Xu Li, Beijing, CN;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G02F 1/13 (2006.01); G06N 3/08 (2006.01); G06T 7/00 (2017.01);
U.S. Cl.
CPC ...
G06T 7/0002 (2013.01); G02F 1/1309 (2013.01); G06N 3/08 (2013.01);
Abstract

Provided are a method for detecting display screen quality, an apparatus, an electronic device and a storage medium. The method includes: receiving a quality detection request sent by a console deployed on a display screen production line, the quality detection request including a display screen image collected by an image collecting device on the display screen production line; inputting the display screen image into a defect detection model to obtain a defect detection result, the defect detection model being obtained by training historical defective display screen images using a structure of deep convolutional neural networks and an object detection algorithm; and determining, according to the defect detection result, a defect on a display screen corresponding to the display screen image, a defect category corresponding to the defect, and a position corresponding to the defect.


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