The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 08, 2020
Filed:
Oct. 19, 2018
Beijing Baidu Netcom Science and Technology Co., Ltd., Beijing, CN;
Jiabing Leng, Beijing, CN;
Minghao Liu, Beijing, CN;
Yang Liang, Beijing, CN;
Yawei Wen, Beijing, CN;
Faen Zhang, Beijing, CN;
Jiangliang Guo, Beijing, CN;
Jin Tang, Beijing, CN;
Shiming Yin, Beijing, CN;
BEIJING BAIDU NETCOM SCIENCE AND TECHNOLOGY CO., LTD., Beijing, CN;
Abstract
The application provides a method and a device for detecting a defect in a steel plate, as well as an apparatus and a server therefor. The method for detecting a defect in a steel plate comprises: receiving image data of the steel plate, and generating a defect detection request according to the image data; monitoring computing loads of a plurality of servers, and sending the image data and the defect detection request to a first server; receiving, from the first server, a detection result obtained by calculating the image data using the detection model; and operating according to the detection result, wherein the detection result comprises a selected one of a pass result and a defect result. With the proposed method, the position and the classification of the at least one defect can be obtained, so that the detection accuracy is improved.