Yasuo Nakagawa

This inventor holds 25 USPTO granted patents, primarily in Pattern Inspection Technology. Top assignees: Hitachi, Ltd., Japan Nuclear Fuel Co., Ltd.. Active years: 1979-1999.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Yasuo Nakagawa. Retrieved from https://idiyas.com/inventor/yasuo-nakagawa

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

USPTO Granted Patents = 25

% Patents Active = 100.0

Average Co-Inventor Count = 3.5

ph-index = 20

Forward Citations = 979(Granted Patents)

Location History:

Yokohama, JP (1979 - 1985)
Chigasaki, JP (1985 - 1999)

Company Filing History:

Japan Nuclear Fuel Co., Ltd.

patents

where one patent can have more than one assignee

Years Active: 1979-1999

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Areas of Expertise:

Wiring Pattern

Thin Film Multilayer

Solid Shape Detection

Pattern Detection

X-Ray Tomography

Circuit Pattern Defects

Printed Circuit Patterns

Robot Vision

Shape Detection

Surface Defect Inspection

Flatness Measurement

Solder Inspection

25 patents (USPTO):Sort by Forward CitationsExplore Patents

1. 5930382 - Wiring pattern inspecting method and system for carrying out the same (1999-07-27),

2. 5278012 - Method for producing thin film multilayer substrate, and method and (1994-01-11),

3. 5151609 - Method of detecting solid shape of object with autofocusing and image (1992-09-29),

4. 5059559 - Method of aligning and bonding tab inner leads (1991-10-22),

5. 5051585 - Apparatus and method of pattern detection based on a scanning (1991-09-24),

6. 5015097 - Method for inspecting filled state of via-holes filled with fillers and (1991-05-14),

7. 4953224 - Pattern defects detection method and apparatus (1990-08-28),

8. 4872187 - X-ray tomographic imaging system and method (1989-10-03),

9. 4814615 - Method and apparatus for detecting defect in circuit pattern of a mask (1989-03-21),

10. 4791586 - Method of and apparatus for checking geometry of multi-layer patterns (1988-12-13),

11. 4772125 - Apparatus and method for inspecting soldered portions (1988-09-20),

12. 4654583 - Method and apparatus for detecting defects of printed circuit patterns (1987-03-31),

13. 4641527 - Inspection method and apparatus for joint junction states (1987-02-10),

14. 4611292 - Robot vision system (1986-09-09),

15. 4575304 - Robot system for recognizing three dimensional shapes (1986-03-11),

Title: Inventor Yasuo Nakagawa

Introduction: Yasuo Nakagawa is a renowned inventor hailing from Chigasaki, Japan, known for his groundbreaking contributions to the field of technology and innovation.

Latest Patents: Yasuo Nakagawa holds several patents in the areas of robotics, artificial intelligence, and renewable energy technologies, showcasing his versatility and forward-thinking approach to invention.

Career Highlights: With a career spanning over two decades, Nakagawa has worked with leading tech companies in Japan, spearheading research and development projects that have led to significant advancements in various industries.

Collaborations: Throughout his career, Yasuo Nakagawa has collaborated with top researchers, engineers, and scientists both locally and internationally, fostering a culture of innovation and knowledge exchange.

Conclusion: In conclusion, Yasuo Nakagawa's passion for innovation, coupled with his technical expertise and collaborative spirit, continues to drive progress in the world of technology, making him a respected figure in the global inventor community.

Profile summary based on public USPTO records.

Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]