This inventor holds 3 USPTO granted patents. Top assignee: Adv Antest Corporation. Active years: 1997-2005.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
Location History:
- Gyoda, JP (1997)
- Tokyo, JP (1998 - 2005)
Company Filing History:
Years Active: 1997-2005
Title: Yasuhiro Kawata: Innovator in Memory Testing Technology
Introduction
Yasuhiro Kawata is a prominent inventor based in Tokyo, Japan. He has made significant contributions to the field of memory testing technology, holding a total of 3 patents. His work focuses on improving the efficiency and accuracy of memory testing methods and apparatus.
Latest Patents
Kawata's latest patents include a memory testing method and apparatus designed to test flash memory in a short time. This innovative method involves writing a predetermined logical value into memory cells of each block and reading it back to compare with an expected value. If discrepancies arise, the system identifies the faulty memory cells and determines whether a block or address line is defective. This approach enhances the reliability of memory devices by allowing for quick identification and analysis of failures.
Another notable patent is the fail address analysis and repair system for semiconductor tests. This invention aims to facilitate the repair of memory devices efficiently, even when failures occur on a repair line. The system counts fail bits for both the memory device and the repair line simultaneously, streamlining the repair process.
Career Highlights
Yasuhiro Kawata is currently employed at Adv Antest Corporation, where he continues to develop innovative solutions in memory testing technology. His expertise and dedication to advancing the field have made him a valuable asset to the company.
Collaborations
Kawata has collaborated with notable colleagues, including Toshikazu Suzuki and Hiromi Oshima. Their combined efforts contribute to the ongoing advancements in semiconductor testing and memory technology.
Conclusion
Yasuhiro Kawata's contributions to memory testing technology exemplify his innovative spirit and commitment to improving the efficiency of semiconductor testing. His patents reflect a deep understanding of the challenges in the field and provide practical solutions for enhancing memory device reliability.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile