The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 24, 1998
Filed:
Nov. 22, 1996
Applicant:
Inventors:
Toshikazu Suzuki, Tokyo, JP;
Yasuhiro Kawata, Tokyo, JP;
Assignee:
Advantest Corporation, Tokyo, JP;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F / ;
U.S. Cl.
CPC ...
371-51 ; 371 211 ;
Abstract
It is an object of the present invention to provide a repair address analysis system for a semiconductor test which can effect repair of a memory device from fails in a short time even when a fail is produced on a repair line. Fail count means effects counting of fail bits for an address value of a memory device and counting of fail bits of an address value of a repair line simultaneously with each other, and information of the repair line is replaced into the counted address.
Quick Actions:
Suzuki, Toshikazu. (1998). Fail address analysis and repair system for semiconductor test (U.S. Patent No. 5841783). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/5841783
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