Yan Avniel

Title: Yan Avniel: Innovator in Semiconductor Technology

Introduction

Yan Avniel is a prominent inventor based in Rehovot, Israel, known for his significant contributions to semiconductor technology. With a total of four patents to his name, Avniel has developed innovative methods that enhance the examination and measurement processes in semiconductor manufacturing.

Latest Patents

One of Avniel's latest patents is focused on image generation for the examination of a semiconductor specimen. This patent describes a system and method that involves obtaining a sequence of frames from an area of the specimen using an electron beam tool. The method includes registering multiple sets of frames acquired from various directions and generating a composite image based on the registration results. Another notable patent addresses measuring height differences in patterns on semiconductor wafers. This technique utilizes real measurements from scanning electron microscope (SEM) images and a height difference determination model, which expresses measurable variables in terms of changes in depth of shadow and tilt angles of the scanning electron beam.

Career Highlights

Yan Avniel is currently employed at Applied Materials Israel Limited, where he continues to push the boundaries of semiconductor technology. His work has been instrumental in developing advanced techniques that improve the accuracy and efficiency of semiconductor examinations.

Collaborations

Avniel collaborates with talented professionals in his field, including Ishai Schwarzband and Sergey Khristo, who contribute to the innovative projects at Applied Materials Israel Limited.

Conclusion

Yan Avniel's work in semiconductor technology exemplifies the spirit of innovation and dedication to advancing the field. His patents reflect a commitment to improving the processes involved in semiconductor manufacturing, making significant strides in the industry.