Camarillo, CA, United States of America

Xing Zhao

This inventor holds 2 USPTO granted patents. Top assignee: Bruker Nano Gmbh. Active years: 2023.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Xing Zhao. Retrieved from https://idiyas.com/inventor/xing-zhao-j59edch2

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


% Patents Active = 100.0

Average Co-Inventor Count = 3.0

ph-index = 1


Company Filing History:


Years Active: 2023

Loading Chart...
2 patents (USPTO):Explore Patents

Title: The Innovative Contributions of Xing Zhao

Introduction

Xing Zhao is a prominent inventor based in Camarillo, California. He has made significant contributions to the field of surface analysis instruments, particularly through his innovative patents. With a total of 2 patents, Zhao continues to push the boundaries of technology in his area of expertise.

Latest Patents

Zhao's latest patents include a metrology probe with a built-in angle and a method of fabrication thereof. This invention involves a method of batch-fabricating an array of probe devices for surface analysis instruments, such as atomic force microscopes (AFM). The process includes providing a wafer and photolithographically forming a base and a cantilever for each probe. The cantilever features a built-in angle, θ, relative to the base, ensuring that the base remains substantially parallel to a sample holder when mounted in a probe holder of the surface analysis instrument.

Another notable patent is the silicon nitride x-ray window and method of manufacture for x-ray detector use. This method outlines the production of a radiation window by patterning a photo resist structure onto a double-sided silicon wafer. The process involves plasma etching the silicon wafer to create an etched silicon wafer with a silicon supporting structure on one side. Following this, a silicon nitride thin film is applied, and further patterning and etching are performed to create an initial window in the silicon nitride thin film.

Career Highlights

Zhao is currently employed at Bruker Nano GmbH, where he applies his expertise in developing advanced technologies. His work has significantly impacted the field of metrology and surface analysis, showcasing his commitment to innovation.

Collaborations

Throughout his career, Zhao has collaborated with notable colleagues, including Joseph S. Fragala and Jeffrey Wong. These collaborations have further enhanced his contributions to the field and fostered a spirit of innovation within his team.

Conclusion

Xing Zhao's innovative patents and contributions to the field of surface analysis instruments highlight his role as a leading inventor. His work continues to influence advancements in technology, making a lasting impact on the industry.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
Loading…