This inventor holds 3 USPTO granted patents and 2 published patent applications. Top assignees: Tongji University, National Institute of Metrology, China, Shanghai Institute of Measurement and Testing Technology. Active years: 2023-2026.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
Company Filing History:
3 out of 248 
1 out of 35 
1 out of 3 Years Active: 2023-2026
Title: Innovations of Inventor Xinbin Cheng
Introduction
Xinbin Cheng is a notable inventor based in Shanghai, China. He has made significant contributions to the field of precision measurement and calibration technologies. With a total of 3 patents, his work focuses on enhancing the accuracy and efficiency of measurement instruments.
Latest Patents
One of his latest patents is titled "Method for calibrating parameter error of electron probe microanalysis instrument." This invention discloses a method for calibrating parameter errors in electron probe microanalysis instruments. It involves preparing a one-dimensional grating standard template using atom lithography technology. The method calculates a theoretical grating period and utilizes the template to perform image acquisition and measurement, ultimately reducing error accumulation in the calibration process.
Another significant patent is the "System for precision displacement measurement based on self-traceable grating interference." This system includes a coherent light source, a photoelectric detection module, and a self-traceable grating. The coherent light source generates laser light that interacts with the self-traceable grating to measure motion displacement and direction accurately.
Career Highlights
Xinbin Cheng has worked at prestigious institutions such as Tongji University and the Shanghai Institute of Measurement and Testing Technology. His experience in these organizations has contributed to his expertise in measurement technologies and instrument calibration.
Collaborations
Throughout his career, Cheng has collaborated with notable colleagues, including Xiao Deng and Zichao Lin. These partnerships have fostered innovation and advancements in their respective fields.
Conclusion
Xinbin Cheng's contributions to precision measurement and calibration technologies are noteworthy. His innovative patents reflect his commitment to enhancing measurement accuracy and efficiency. His work continues to influence the field and inspire future innovations.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile