The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 31, 2023

Filed:

Jan. 27, 2022
Applicant:

Tongji University, Shanghai, CN;

Inventors:

Xiao Deng, Shanghai, CN;

Xinbin Cheng, Shanghai, CN;

Zichao Lin, Shanghai, CN;

Zhenjie Gu, Shanghai, CN;

Yulin Yao, Shanghai, CN;

Tongbao Li, Shanghai, CN;

Assignee:

Tongji University, Shanghai, CN;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01B 9/02 (2022.01); G01B 9/02001 (2022.01); G01S 7/481 (2006.01); G01S 17/08 (2006.01);
U.S. Cl.
CPC ...
G01B 9/02007 (2013.01); G01S 7/4818 (2013.01); G01S 17/08 (2013.01); G01B 2290/30 (2013.01);
Abstract

A system for precision displacement measurement based on a self-traceable grating interference includes a coherent light source, a photoelectric detection module, a self-traceable grating and a signal processing module. The self-traceable grating is arranged on a to-be-measured displacement motion platform. The coherent light source, the photoelectric detection module and the signal processing module are sequentially connected. Laser generated by the coherent light source propagates through the photoelectric detection module and is incident on the self-traceable grating, diffracts with the self-traceable grating, returns to the photoelectric detection module to continue propagating and enters the signal processing module. The signal processing module collects an interference signal to obtain a motion displacement and a motion direction.


Find Patent Forward Citations

Deng, Xiao. (2023). System for precision displacement measurement based on self-traceable grating interference (U.S. Patent No. 11802758). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/11802758

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Loading…