This inventor holds 2 USPTO granted patents and 1 published patent application. Top assignees: Tongji University, National Institute of Metrology, China. Active years: 2023-2026.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
Company Filing History:
Years Active: 2023-2026
Title: Innovations of Tongbao Li in Precision Displacement Measurement
Introduction
Tongbao Li is a notable inventor based in Shanghai, China. He has made significant contributions to the field of precision measurement technology. His innovative work has led to the development of a unique system that enhances the accuracy of displacement measurements.
Latest Patents
Tongbao Li holds a patent for a "System for precision displacement measurement based on self-traceable grating interference." This system includes a coherent light source, a photoelectric detection module, a self-traceable grating, and a signal processing module. The self-traceable grating is strategically arranged on a displacement motion platform that is to be measured. The coherent light source generates laser light that propagates through the photoelectric detection module and interacts with the self-traceable grating. The diffracted light returns to the photoelectric detection module and continues to the signal processing module. This module collects interference signals to determine both motion displacement and direction.
Career Highlights
Tongbao Li is affiliated with Tongji University, where he contributes to research and development in precision measurement technologies. His work is recognized for its innovative approach and practical applications in various fields.
Collaborations
He collaborates with esteemed colleagues such as Xiao Deng and Xinbin Cheng, who share his passion for advancing measurement technologies.
Conclusion
Tongbao Li's contributions to precision displacement measurement exemplify the impact of innovative thinking in technology. His patent reflects a significant advancement in the field, showcasing his expertise and dedication to research.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile