This inventor holds 1 USPTO granted patent and 1 published patent application. Top assignee: Tongji University. Active years: 2023.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
Company Filing History:
Years Active: 2023
Title: Innovations of Zhenjie Gu in Precision Displacement Measurement
Introduction
Zhenjie Gu is a notable inventor based in Shanghai, China. He has made significant contributions to the field of precision measurement technology. His innovative work focuses on enhancing the accuracy of displacement measurement systems.
Latest Patents
Zhenjie Gu holds a patent for a "System for precision displacement measurement based on self-traceable grating interference." This system includes a coherent light source, a photoelectric detection module, a self-traceable grating, and a signal processing module. The self-traceable grating is strategically arranged on a displacement motion platform that is to be measured. The coherent light source generates laser light that propagates through the photoelectric detection module and interacts with the self-traceable grating. The diffracted light returns to the photoelectric detection module, where it continues to the signal processing module. This module collects interference signals to determine both motion displacement and direction. Zhenjie Gu has 1 patent to his name.
Career Highlights
Zhenjie Gu is affiliated with Tongji University, where he contributes to research and development in precision measurement technologies. His work is recognized for its practical applications in various engineering fields.
Collaborations
Zhenjie Gu collaborates with esteemed colleagues such as Xiao Deng and Xinbin Cheng. Their combined expertise enhances the research output and innovation potential within their projects.
Conclusion
Zhenjie Gu's contributions to precision displacement measurement technology exemplify the impact of innovative thinking in engineering. His patent reflects a significant advancement in measurement systems, showcasing his dedication to enhancing accuracy in this field.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile