Xiao Deng

Title: Innovations of Inventor Xiao Deng

Introduction

Xiao Deng is a prominent inventor based in Shanghai, China. He has made significant contributions to the field of precision measurement and calibration technologies. With a total of 3 patents, his work focuses on enhancing the accuracy and efficiency of measurement instruments.

Latest Patents

Xiao Deng's latest patents include a "Method for calibrating parameter error of electron probe microanalysis instrument." This innovative method involves preparing a one-dimensional grating standard template using atom lithography technology. The process calculates a theoretical grating period and utilizes the electron probe microanalysis instrument to perform image acquisition and measurement, ultimately reducing error accumulation in the calibration process.

Another notable patent is the "System for precision displacement measurement based on self-traceable grating interference." This system comprises a coherent light source, a photoelectric detection module, a self-traceable grating, and a signal processing module. The coherent light source generates laser light that interacts with the self-traceable grating, allowing for precise measurement of motion displacement and direction.

Career Highlights

Xiao Deng has worked at esteemed institutions such as Tongji University and the Shanghai Institute of Measurement and Testing Technology. His experience in these organizations has contributed to his expertise in measurement technologies and instrument calibration.

Collaborations

Xiao has collaborated with notable colleagues, including Xinbin Cheng and Zichao Lin. Their combined efforts have further advanced the field of precision measurement.

Conclusion

Xiao Deng's innovative patents and career achievements highlight his significant contributions to measurement technology. His work continues to influence the industry and improve the accuracy of scientific instruments.