Williston, VT, United States of America

William Y Chang

This inventor holds 2 USPTO granted patents. Top assignee: International Business Machines Corporation. Active years: 2009.

IDiyas Innovation Intelligence. (2026). Inventor Profile: William Y Chang. Retrieved from https://idiyas.com/inventor/william-y-chang

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


Average Co-Inventor Count = 3.3

ph-index = 1

Forward Citations = 2(Granted Patents)


Company Filing History:


Years Active: 2009

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2 patents (USPTO):Explore Patents

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Title: Exploring the Inventive Mind of William Y Chang

Introduction: William Y Chang, a brilliant inventor based in Williston, VT (US), has made significant contributions to the field of semiconductor technology through his innovative patents.

Latest Patents: Chang's latest patents showcase his expertise. The first patent, "Structure and Method for Monitoring Variation within an Active Region of a Semiconductor Device Using Scaling," revolutionizes semiconductor wafer monitoring by introducing parameter scaling metrics. The second patent, "Equivalent Gate Count Yield Estimation for Integrated Circuit Devices," introduces a novel method for modeling yield in semiconductor products.

Career Highlights: Currently working at IBM (International Business Machines), Chang has proven to be an invaluable asset to the company. His innovative ideas have pushed the boundaries of semiconductor technology and have helped IBM stay at the forefront of industry advancements.

Collaborations: Chang's collaborations with coworkers such as Sharon Lynne Von Bruns and Thomas S Barnett have further enriched his work. Together, they have contributed to the development of cutting-edge technologies in the semiconductor field.

Conclusion: William Y Chang's inventive spirit and dedication to advancing semiconductor technology make him a standout inventor in his field. His patents continue to shape the industry, and his collaborations highlight his ability to work seamlessly with colleagues to bring innovative ideas to life.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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