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For the Inventor, By the Inventor

Hsinchu, Taiwan

Wen-Chi Chen

This inventor holds 2 USPTO granted patents. Top assignee: Mpi Corporation. Active years: 2015-2022.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Wen-Chi Chen. Retrieved from https://idiyas.com/inventor/wen-chi-chen-xbdkci3d

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

USPTO Granted Patents = 2

% Patents Active = 100.0

Average Co-Inventor Count = 4.6

ph-index = 1

Forward Citations = 4(Granted Patents)


Location History:

  • Chu-Pei, TW (2015)
  • Hsinchu County, TW (2022)

Company Filing History:

goldMedal2 out of 152 
 
Mpi Corporation
 patents

Years Active: 2015-2022

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2 patents (USPTO):Explore Patents
1. 11402407 - Positionable probe card and manufacturing method thereof (2022-08-02),
2. 8933719 - Combined probe head for a vertical probe card and method for assembling and aligning the combined probe head thereof (2015-01-13),

Title: Innovations of Wen-Chi Chen

Introduction

Wen-Chi Chen is a notable inventor based in Hsinchu County, Taiwan. He has made significant contributions to the field of probe card technology, holding 2 patents that showcase his innovative spirit and technical expertise.

Latest Patents

Wen-Chi Chen's latest patents include the "Positionable Probe Card and Manufacturing Method Thereof." This invention features a positionable probe card that consists of a space transformer, multiple positioning pins, and a probe head. The space transformer is designed with a substrate that contains several apertures, allowing the positioning pins to be fixed within them. The probe head is equipped with positioning holes that correspond to the positioning pins, facilitating precise alignment. Additionally, a method for manufacturing this positionable probe card is disclosed.

Another significant patent is the "Combined Probe Head for a Vertical Probe Card and Method for Assembling and Aligning the Combined Probe Head Thereof." This invention introduces a combined probe head that is integrated into a vertical probe card's space transformer. The combined probe head is designed to differentiate or segment the layout area of the probes, minimizing mutual interference during the repair process. It includes a locating plate with fixed portions and sub-probe heads that contain corresponding sub-dies and probes.

Career Highlights

Wen-Chi Chen is currently employed at Mpi Corporation, where he continues to develop innovative solutions in the field of probe card technology. His work has significantly impacted the efficiency and effectiveness of testing semiconductor devices.

Collaborations

Wen-Chi Chen collaborates with talented individuals such as Chao-Ching Huang and Chiu-Chu Chang, who contribute to the innovative environment at Mpi Corporation.

Conclusion

Wen-Chi Chen's contributions to probe card technology through his patents reflect his dedication to innovation and excellence in engineering. His work continues to influence the semiconductor testing industry, showcasing the importance of inventive minds in advancing technology.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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