The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 13, 2015

Filed:

Jul. 25, 2011
Applicants:

Chao-ching Huang, Chu-Pei, TW;

Wen-chi Chen, Chu-Pei, TW;

Chiu-chu Chang, Chu-Pei, TW;

Inventors:

Chao-Ching Huang, Chu-Pei, TW;

Wen-Chi Chen, Chu-Pei, TW;

Chiu-Chu Chang, Chu-Pei, TW;

Assignee:

MPI Corporation, Chu-Pei, TW;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01R 31/00 (2006.01); G01R 1/073 (2006.01); G01R 31/28 (2006.01); G01R 3/00 (2006.01);
U.S. Cl.
CPC ...
G01R 1/07342 (2013.01); G01R 31/2889 (2013.01); G01R 3/00 (2013.01);
Abstract

A combined probe head being disposed in a space transformer of a vertical probe card is provided, in which the combined probe head is used for differentiating or segmenting a layout area of the probes in the vertical probe card. The combined probe head may include a locating plate and sub-probe heads. The locating plate may include fixed portions. Each sub-probe head may include corresponding sub-dies and probes inserted between the sub-dies, and each sub-probe head is assembled and fixed in the corresponding fixed portion. Therefore, the layout area of the probes in the vertical probe card can be respectively differentiated or segmented from the sub-probe heads in order to avoid mutual interference under repair process. In addition, a related method for assembling and aligning the above mentioned combined probe head is provided.


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