Wei-jhih Su

Title: Wei-jhih Su’s Patent Innovations in Probe Card Technology.

Introduction

Wei-jhih Su is an inventor based in Taichung, Taiwan, whose patent work focuses on probe card devices and probe modules used in semiconductor testing. His portfolio includes 8 patents.

Latest Patents

Su’s recent inventions address probe configurations and testing performance.

“Probe Card Device Having Expansion Configuration and Probe Head Thereof” describes a probe head with two spaced guide board modules, conductive probes, and an auxiliary probe. The auxiliary probe electrically couples to at least one conductive probe through a connection circuit, while the conductive probes can detachably contact a device under test. The auxiliary probe is fixed in a guide board module and faces the device under test without touching it.

“Cantilever Probe Card Device and Cantilever Probe Module” describes a module containing first and second probes with differently configured segments. The probes’ main segments are staggeredly fixed to a substrate, while their testing segments align in a single row. The design specifies that the second probe’s extending segment has a height between 5% and 50% of its main segment’s height.

Career Highlights

Su has been associated with Chunghwa Precision Test Tech. Co., Ltd. His patent work reflects a focus on probe card structures and the arrangement of probes for semiconductor testing.

Collaborations

Among Su’s listed coworkers are Hao-yen Cheng and Rong-Yang Lai.

Conclusion

Wei-jhih Su’s patents center on probe card and probe module designs, with innovations aimed at probe arrangement, electrical coupling, and device testing.