Wei-jhih Su

This inventor holds 8 USPTO granted patents and 9 published patent applications. Top assignees: Chunghwa Precision Test Tech. Co., Ltd., Chunghwa Precision Test Tech. Co., Ltd.. Active years: 2026.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Wei-jhih Su. Retrieved from https://idiyas.com/inventor/wei-jhih-su-e1n08srn

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

USPTO Granted Patents = 8 (Patent Applications = 9)

Average Co-Inventor Count = 4.0

ph-index = 1

Company Filing History:

4 out of 7

Chunghwa Precision Test Tech. Co., Ltd.

patents

1 out of 50

Chunghwa Precision Test Tech. Co., Ltd.

patents

where one patent can have more than one assignee

Years Active: 2026

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8 patents (USPTO):Sort by Forward CitationsExplore Patents

1. 12730129 - Probe card device having expansion configuration and probe head thereof (2026-09-08),

2. 12663439 - Cantilever probe card device and cantilever probe module (2026-06-23),

3. 12625163 - Cantilever probe card device and climb-restricting probe (2026-05-12),

4. 12601761 - Vertical probe card and open-type probe thereof (2026-04-14),

5. 12601760 - Probe card device and tunnel-type probe thereof (2026-04-14),

6. 12601759 - Cantilever probe card device and light scattering probe (2026-04-14),

7. 12590994 - Cantilever probe card device and solder receiving probe (2026-03-31),

8. 12590990 - Cantilever probe card device and micro electro mechanical system (MEMS) probe (2026-03-31),

Profile summary based on public USPTO records.

Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]

9 patents pending: