The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 08, 2026
Filed:
Jan. 02, 2025
Chunghwa Precision Test Tech. Co., Ltd., Taoyuan City, TW;
Yu-Ju Lu, Taoyuan City, TW;
Hao-Yen Cheng, Taoyuan City, TW;
Rong-Yang Lai, Taoyuan City, TW;
Wei-Jhih Su, Taichung City, TW;
CHUNGHWA PRECISION TEST TECH. CO., LTD., Taoyuan City, TW;
Abstract
A probe head of a probe card device includes two guide board modules spaced apart from each other, a plurality of conductive probes, and an auxiliary probe, the latter two of which are assembled to the two guide board modules. At least one of the conductive probes abuts against a connection circuit of one of the two guide board modules. One end of each of the conductive probes protrudes from one of the two guide board modules and is configured to detachably abut against a device under test (DUT). The auxiliary probe abuts against the connection circuit so as to be electrically coupled to the at least one of the conductive probes. One end of the auxiliary probe is fixed in the one of the two guide board modules, and faces toward and is not in contact with the DUT.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile