Hao-yen Cheng

Title: Hao-yen Cheng: Probe Card and Testing Innovations.

Introduction.

Hao-yen Cheng is an inventor based in Taoyuan, Taiwan. His work focuses on probe card technologies and probe modules used to test electronic devices. He holds 6 patents.

Latest Patents.

Probe Card Device Having Expansion Configuration and Probe Head Thereof. This invention describes a probe head with two spaced guide board modules, conductive probes, and an auxiliary probe. The conductive probes can detachably contact a device under test, while the auxiliary probe electrically couples to at least one conductive probe without contacting the device under test.

Cantilever Probe Card Device and Cantilever Probe Module. This invention features first and second probes with differently configured arm, main, extending, and testing segments. The probes are arranged so their testing segments form a single row when their main segments are staggeredly fixed to a substrate. The extending segment’s height is specified as 5% to 50% of the second main segment’s height.

Career Highlights.

Cheng is associated with Chunghwa Precision Test Tech. Co., Ltd. His patent work reflects a focus on probe card structures and configurations for electronic testing.

Collaborations.

Cheng’s listed coworkers include Wei-jhih Su and Rong-Yang Lai. These professional connections provide context for his work in probe card and testing technologies.

Conclusion.

Hao-yen Cheng’s six patents and described probe card inventions highlight his contributions to the design of probe heads and cantilever probe modules for device testing.