The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 23, 2026
Filed:
Apr. 11, 2024
Chunghwa Precision Test Tech. Co., Ltd., Taoyuan City, TW;
Hao-Yen Cheng, Taoyuan City, TW;
Rong-Yang Lai, Taoyuan City, TW;
Chao-Hui Tseng, New Taipei City, TW;
Wei-Jhih Su, Taichung City, TW;
CHUNGHWA PRECISION TEST TECH. CO., LTD., Taoyuan City, TW;
Abstract
A cantilever probe module includes a plurality of first probes and a plurality of second probes. Each of the first probes includes a first arm segment, a first main segment, and a first testing segment, the latter two of which are respectively connected to two ends of the first arm segment. Each of the second probes includes a second arm segment, an extending segment and a second testing segment both respectively connected to two ends of the second arm segment, and a second main segment that is connected to the extending segment. A height of the extending segment is 5% to 50% of a height of the second main segment. When the first main segments of the first probes and the second main segments of the second probes are staggeredly fixed onto a substrate, the first testing segments and the second testing segments are arranged in one row.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile