This inventor holds 5 USPTO granted patents. Top assignees: Chunghwa Precision Test Tech. Co., Ltd., Chunghwa Precision Test Tech. Co., Ltd.. Active years: 2026.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
Company Filing History:
3 out of 7 
1 out of 50 Years Active: 2026
Title: Chao-hui Tseng: Probe Card and Testing Technology Inventor
Introduction
Chao-hui Tseng is an inventor based in Taipei, Taiwan, whose work includes innovations in cantilever probe cards and probe modules. Tseng is a woman and is credited with 5 patents.
Latest Patents
One of Tseng’s latest inventions, “Cantilever Probe Card Device and Cantilever Probe Module,” describes a module with first and second probes arranged so their testing segments form a single row. The probes use differently configured arm, main, extending, and testing segments, with the extending segment measuring 5% to 50% of the second main segment’s height.
Another invention, “Cantilever Probe Card Device and Climb-Restricting Probe,” features a ring around the probe’s main segment. The ring is designed to prevent solder from climbing past it, and its restriction height ranges from 3 to 50 micrometers.
Career Highlights
Tseng is associated with Chunghwa Precision Test Tech. Co., Ltd. Her patent work focuses on probe structures and arrangements used in testing devices.
Collaborations
Tseng’s listed coworkers include Hao-yen Cheng and Wei-jhih Su. These professional associations provide context for her work in precision testing technology.
Conclusion
Chao-hui Tseng’s patents address practical probe design challenges, including probe alignment and controlling solder movement, contributing to developments in cantilever probe card technology.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile