Rong-Yang Lai

Title: Rong-Yang Lai’s Probe-Card Inventions

Introduction

Rong-Yang Lai is an inventor based in Taoyuan City, Taiwan. His work focuses on probe-card technology and probe modules used to test electronic devices. He is associated with Chunghwa Precision Test Tech. Co., Ltd. Lai is credited with 5 patents.

Latest Patents

“Probe Card Device Having Expansion Configuration and Probe Head Thereof” describes a probe head with two spaced guide-board modules, conductive probes, and an auxiliary probe. The conductive probes can detachably contact a device under test, while the auxiliary probe electrically couples to at least one conductive probe through a connection circuit. Its end is fixed in a guide-board module and faces the device under test without touching it.

“Cantilever Probe Card Device and Cantilever Probe Module” describes a module containing first and second probes with differently configured arm, main, extending, and testing segments. The extending segment is 5% to 50% of the height of the second probe’s main segment. When the probes are staggered on a substrate, their testing segments align in a single row.

Career Highlights

Lai’s listed inventions address probe arrangement, electrical connections, and testing configurations in probe-card devices. These designs focus on how probe components are supported and positioned for contact with devices under test.

Collaborations

Lai is associated with Chunghwa Precision Test Tech. Co., Ltd. His listed coworkers include Hao-yen Cheng and Wei-jhih Su.

Conclusion

Rong-Yang Lai’s patent work centers on probe-card and cantilever-probe designs, with an emphasis on probe configuration and electrical coupling for device testing.