Yu-ju Lu

Title: Yu-ju Lu’s Patent Innovations in Probe Card Technology.

Introduction

Yu-ju Lu is an inventor based in Taoyuan, Taiwan, whose patent work focuses on probe card devices and probe structures used to test electronic devices. Lu is associated with Chunghwa Precision Test Tech. Co., Ltd. The supplied information lists 3 patents.

Latest Patents

Two of Lu’s latest patents concern probe card technology.

“Probe Card Device Having Expansion Configuration and Probe Head Thereof” describes a probe head with two spaced guide board modules, conductive probes, and an auxiliary probe. The auxiliary probe electrically couples to at least one conductive probe through a connection circuit, while the conductive probes can detachably contact a device under test. The auxiliary probe is fixed within a guide board module and faces the device under test without touching it.

“Probe Card Device and Tunnel-Type Probe Thereof” describes a tunnel-type probe comprising a tube, an elastic member, and a movable pin. The pin connects electrically to the tube through the elastic member. When its contacting segment presses against a device under test, the pin moves and deforms the elastic member, which generates an elastic force.

Career Highlights

Lu’s listed patent work addresses probe configurations and mechanical features that support electrical testing of devices under test. The inventions describe ways to arrange conductive components and use elastic force within probe assemblies.

Collaborations

Lu is associated with Chunghwa Precision Test Tech. Co., Ltd. The supplied information also identifies Wei-jhih Su and Yi-hsien Chen as coworkers.

Conclusion

Yu-ju Lu’s patents focus on probe card and tunnel-type probe designs, contributing technical approaches to device testing through probe arrangement, electrical coupling, and elastic movement.