Yongin, South Korea

Wan Soon Park

This inventor holds 2 USPTO granted patents. Top assignee: Yc Corporation. Active years: 2025.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Wan Soon Park. Retrieved from https://idiyas.com/inventor/wan-soon-park

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


% Patents Active = 100.0

Average Co-Inventor Count = 1.6

ph-index = 1


Company Filing History:


Years Active: 2025

Loading Chart...
2 patents (USPTO):Explore Patents

Title: Innovations by Wan Soon Park

Introduction

Wan Soon Park is a notable inventor based in Yongin-si, South Korea. He has made significant contributions to the field of semiconductor technology. His innovative work focuses on enhancing the efficiency of semiconductor testing processes.

Latest Patents

Wan Soon Park holds a patent for a semiconductor test apparatus capable of inducing a reduction in power consumption. This apparatus includes a test management unit that determines a test mode, generates a test signal according to the determined mode, and transmits the signal to fail memories. The design incorporates one or more fail memory boards that store fail signals generated from tests conducted in accordance with the test signal. Notably, if the determined test mode is a first test mode, at least some of the failure memory boards are powered off, which contributes to energy efficiency.

Career Highlights

Wan Soon Park is currently employed at Yc Corporation, where he continues to develop innovative solutions in semiconductor technology. His work has been instrumental in advancing the capabilities of semiconductor testing.

Collaborations

He collaborates with talented colleagues, including Hyo Sang Jo and Yong Hyun Kim, who contribute to the innovative environment at Yc Corporation.

Conclusion

Wan Soon Park's contributions to semiconductor technology through his patent and work at Yc Corporation highlight his role as a significant inventor in the field. His innovations are paving the way for more efficient semiconductor testing processes.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
Loading…