For the Inventor, By the Inventor

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Seongnam-si, South Korea

Yc Corporation

USPTO Granted Patents = 4

Forward Citations = 0

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7 inventors (with patents filed for the assignee):

Yong Hyun Kim (2 out of 40 patents)

Wan Soon Park (2 out of 2 patents)

Hyo Sang Jo (2 out of 2 patents)

4. Jae Hoon Joo (2 out of 2 patents)

5. Ki Young Jeon (1 out of 1 patent)

6. Kwang Hwa Lee (1 out of 1 patent)

7. Dong Je Jeon (1 out of 1 patent)

4 patents: Sort by Forward Citations

1. 12498419 - Semiconductor test apparatus using FPGA and memory control method for semiconductor test (2025-12-16),

2. 12469579 - Semiconductor test apparatus capable of inducing reduction of power consumption (2025-11-11),

3. 12461142 - Semiconductor wafer test system for controlling supply of power to semiconductor wafer test apparatus and method of controlling supply of power to semiconductor wafer test apparatus (2025-11-04),

4. 12422162 - Cooling method and apparatus using internal circulation air flow (2025-09-23),

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USPTO Data Jan 1 1976 - Jan 6 2026

4 Patents

#94 in Seongnam-si

#2,091 in South Korea

Seongnam-si, South Korea

Yc Corporation

Forward Citations = 0

7 inventors:

Yong Hyun Kim (2 out of 40 patents)

Wan Soon Park (2 out of 2 patents)

Hyo Sang Jo (2 out of 2 patents)

4. Jae Hoon Joo (2 out of 2 patents)

5. Ki Young Jeon (1 out of 1 patent)

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