The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 16, 2025
Filed:
Jun. 13, 2023
Applicant:
Yc Corporation, Seongnam-si, KR;
Inventor:
Wan Soon Park, Yongin-si, KR;
Assignee:
YC Corporation, Gyeonggi-Do, KR;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01R 31/317 (2006.01); G01R 31/3193 (2006.01);
U.S. Cl.
CPC ...
G01R 31/31724 (2013.01); G01R 31/31935 (2013.01);
Abstract
A semiconductor test apparatus comprises a failure memory (FM) block configured to store failure data generated from a result of testing a semiconductor device, a buffer memory (BM) block to/in which the failure data stored in the FM block is configured to be copied/stored, and a field programmable gate array (FPGA) configured to perform a first control operation to control the FM block and a second control operation to control the BM block.