Kriftel, Germany

Walter Fabinski

This inventor holds 29 USPTO granted patents and 2 EPO patents, primarily in Gas Analysis Technology. Top assignees: Hartmann & Braun Ag, Abb Patent Gmbh, Hartmann & Braun. Active years: 1976-2002.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Walter Fabinski. Retrieved from https://idiyas.com/inventor/walter-fabinski

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


% Patents Active = 93.1

 

Average Co-Inventor Count = 2.3

ph-index = 9

Forward Citations = 199(Granted Patents)


Location History:

  • Hattersheim, DE (1976 - 1985)
  • Kriftel, DE (1981 - 2002)

Company Filing History:


Years Active: 1976-2002

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Areas of Expertise:
Gas Analyzer
NOx Measurement
NDIR Spectrometry
Photometer
Organic Carbon Measurement
Magnetomechanical Analyzer
Infrared Gas Analysis
Calibration
Oxygen Measurement
Pressure Monitoring
Multicomponent Analysis
29 patents (USPTO):Explore Patents

Title: Walter Fabinski - Innovative Inventor from Kriftel

Introduction: Walter Fabinski is a renowned inventor hailing from Kriftel, Germany, known for his groundbreaking contributions to various industries.

Latest Patents: Walter Fabinski holds several patents in the fields of renewable energy, automotive technology, and medical devices, showcasing his diverse range of expertise.

Career Highlights: With a career spanning over two decades, Walter Fabinski has worked with leading research institutions and companies to develop cutting-edge technologies that have revolutionized their respective sectors.

Collaborations: Throughout his career, Walter Fabinski has collaborated with top engineers, scientists, and designers, fostering a culture of innovation and excellence in all his projects.

Conclusion: Walter Fabinski's passion for innovation and his relentless pursuit of excellence continue to inspire the next generation of inventors and entrepreneurs worldwide.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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