The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 23, 1996

Filed:

Jan. 13, 1995
Applicant:
Inventors:

Walter Fabinski, Kriftel, DE;

Gerhard Wiegleb, Neu-Anspach, DE;

Peter Hering, Garching, DE;

Werner Fuss, Garching, DE;

Michael Haisch, Dusseldorf, DE;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N / ;
U.S. Cl.
CPC ...
250345 ; 356437 ;
Abstract

A method and an apparatus for the selective determination of an isotope portion of a measuring gas by means of non-dispersive spectroscopy. The method includes sensitizing in a first ray path to the isotope component and sensitizing in a second ray path to the isotope-pure measuring gas, and electronically amplifying the measurement results. In order to improve the selectively and the sensitivity while maintaining a simple construction, an additional optical filtering is carried out in the first ray path by a filter filled essentially with isotope-pure measuring gas and the electronic measuring value of the second ray path is entered by influencing the amplification factor and an offset in the electronic amplification of the first ray path.


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