The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 31, 1991
Filed:
Oct. 01, 1990
Walter Fabinski, Kriftel, DE;
Guenter Bernhardt, Frankfurth, DE;
Hartmann & Braun AG, Frankfurt am Main, DE;
Abstract
Compensation and calibration method for a nondispersive infrared gas analyzer which includes an infrared source of radiation, a measuring path, a reference path, modulation devices, a detector for differential pressure measuring, comprises the following steps: first and prior to measurement, the reference gas having a variable basic concentration in the measuring component is forced through the reference branch and through the measuring branch and the detector is set to a zero position; next a dual calibration chamber is placed into the two reference paths while both of them are still passed through by the reference gas, one of the calibration chambers including a particular concentration in the measuring gas the other one lacking that measuring gas; now the sensitivity and amplification of the detector that obtains as a result of changes in the radiation on account of placing the calibration chamber into the reference and measuring path is adjusted, whereupon the calibration chamber is removed, reference gas still is passed through the reference chamber, while measuring gas now flows through the measuring chamber.