Company Filing History:
Years Active: 2020-2025
Title: Volker Wieczorek: Innovator in Charged Particle Microscopy
Introduction
Volker Wieczorek is a notable inventor based in Neu-Ulm, Germany. He has made significant contributions to the field of charged particle microscopy, holding two patents that showcase his innovative approach to technology.
Latest Patents
His latest patents include a multi-beam digital scan and image acquisition system. This invention features a multi-beam charged particle microscope designed for wafer inspection, offering high throughput, high resolution, and high reliability. The method of operation involves synchronized scanning and image acquisition by multiple charged particle beamlets, tailored to specific inspection tasks through a selected scan program. Another patent focuses on a component for a projection exposure apparatus, which includes a printed circuit board housed in an encapsulated structure. This design incorporates electronic components and a heat conducting structure to efficiently dissipate heat from the components to the exterior of the housing.
Career Highlights
Volker Wieczorek has worked with prominent companies in the field, including Carl Zeiss SMT GmbH and Carl Zeiss Multisem GmbH. His experience in these organizations has contributed to his expertise and innovative capabilities in charged particle technology.
Collaborations
Some of his notable coworkers include Thomas Wolfsteiner and Stefan Krone, who have collaborated with him on various projects.
Conclusion
Volker Wieczorek's contributions to charged particle microscopy and his innovative patents reflect his dedication to advancing technology in this field. His work continues to influence the industry and inspire future innovations.