Vivekanand Kini

Title: Vivekanand Kini: Innovator in Electron Beam Inspection Technology

Introduction

Vivekanand Kini is a notable inventor based in Sunnyvale, CA (US). He has made significant contributions to the field of electron beam inspection technology. With a total of 3 patents, his work has advanced the capabilities of inspection systems in various applications.

Latest Patents

One of his latest patents is titled "Method and system for adaptively scanning a sample during electron beam inspection." This innovative system is designed to scan an electron beam across the surface of a sample. The inspection sub-system includes an electron beam source, a sample stage, a set of electron-optic elements, a detector assembly, and a controller that is communicatively coupled to various portions of the inspection sub-system. The controller assesses characteristics of specific areas of the sample for inspection and adjusts scan parameters accordingly, enhancing the efficiency and accuracy of the inspection process.

Career Highlights

Vivekanand Kini has worked with prominent companies in the technology sector, including KLA-Tencor Corporation and KLA-Tencor Technologies Corporation. His experience in these organizations has allowed him to develop and refine his innovative ideas in electron beam inspection.

Collaborations

Throughout his career, Vivekanand has collaborated with talented individuals such as Gary Fan and David Chen. These collaborations have contributed to the advancement of his projects and the successful development of his patents.

Conclusion

Vivekanand Kini's contributions to electron beam inspection technology demonstrate his innovative spirit and dedication to advancing the field. His patents reflect a commitment to improving inspection systems, making significant strides in technology.