Location History:
- Cupertino, CA (US) (1983)
- Palo Alto, CA (US) (1981 - 1991)
Company Filing History:
Years Active: 1981-1991
Title: The Innovative Contributions of Vincent J Coates
Introduction
Vincent J Coates is a notable inventor based in Palo Alto, CA, with a significant portfolio of innovations. He holds a total of 9 patents, showcasing his expertise in the field of optical systems and materials science. His work has contributed to advancements in methods for measuring reflectance and normalizing detection signals in imaging systems.
Latest Patents
One of Coates' latest patents is a method for determining the absolute reflectance of a material. This innovative approach allows for the calculation of a material's reflectance at a predetermined wavelength in the ultraviolet range. The method involves measuring the reflectance from a known material, such as single crystal silicon, and applying a system efficiency coefficient to obtain the absolute value of an unknown material's reflectance.
Another significant patent focuses on normalizing the detection signals of magnified images. This feedback method, or automatic gain control circuit, is designed for an image photosensor at the focal plane of an optical system. It is particularly useful for very narrow linewidth measurements of images with varying intensities, such as fluorescing photoresist coated lines. The method enhances the accuracy of measurements by normalizing the output signal of the photosensor based on instantaneous intensity measurements.
Career Highlights
Vincent J Coates has made substantial contributions to the field of optical measurement technologies through his work at Nanometrics Inc. His innovative methods have paved the way for improved accuracy and efficiency in various applications.
Collaborations
Coates has collaborated with notable colleagues, including Warren Lin and Duane C Holmes, further enhancing the impact of his work in the industry.
Conclusion
Vincent J Coates is a distinguished inventor whose contributions to optical measurement technologies have significantly advanced the field. His innovative patents reflect his commitment to improving measurement accuracy and efficiency in various applications.