Zikron Ya'akov, Israel

Vincent Immer

This inventor holds 4 USPTO granted patents. Top assignee: Kla Tencor Corporation. Active years: 2019-2022.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Vincent Immer. Retrieved from https://idiyas.com/inventor/vincent-immer

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


% Patents Active = 100.0

Average Co-Inventor Count = 3.3

ph-index = 1

Forward Citations = 2(Granted Patents)


Location History:

  • Zikrom Yaakov, IL (2019)
  • Zikron Yaakov, IL (2019 - 2022)

Company Filing History:


Years Active: 2019-2022

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4 patents (USPTO):Explore Patents

Title: Vincent Immer: Innovator in Semiconductor Measurement Technologies

Introduction

Vincent Immer is a notable inventor based in Zikron Yaakov, Israel. He has made significant contributions to the field of semiconductor device fabrication, holding a total of 4 patents. His work focuses on enhancing the accuracy and efficiency of spectral measurement techniques.

Latest Patents

Among his latest patents is a groundbreaking device and method for expediting spectral measurement in metrological activities during semiconductor device fabrication. This innovation utilizes interferometric spectroscopy of white light illumination during calibration, overlay, and recipe creation. This advancement is crucial for improving the precision of semiconductor manufacturing processes.

Career Highlights

Vincent Immer is currently employed at KLA-Tencor Corporation, a leading company in the semiconductor industry. His role involves developing innovative solutions that streamline measurement processes, thereby enhancing the overall efficiency of semiconductor fabrication.

Collaborations

Vincent has collaborated with talented professionals such as Tal Marciano and Naomi Ittah. These partnerships have fostered a creative environment that encourages the development of cutting-edge technologies in the semiconductor field.

Conclusion

Vincent Immer's contributions to semiconductor measurement technologies exemplify his commitment to innovation and excellence. His patents and collaborative efforts continue to shape the future of semiconductor device fabrication.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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