Dresden, Germany

Ulrich Mantz

This inventor holds 9 USPTO granted patents. Top assignees: Infineon Technologies Ag, Infineon Technologies Richmond, LP, Siemens Aktiengesellschaft. Active years: 2000-2008.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Ulrich Mantz. Retrieved from https://idiyas.com/inventor/ulrich-mantz-q3tkph9n

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


% Patents Active = 33.3

Average Co-Inventor Count = 2.4

ph-index = 3

Forward Citations = 74(Granted Patents)


Location History:

  • Poughkeepsie, NY (US) (2000)
  • Dresden, DE (2002 - 2008)
  • Saxony, DE (2006 - 2008)

Company Filing History:


Years Active: 2000-2008

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9 patents (USPTO):Explore Patents

Title: The Innovations of Ulrich Mantz: Pioneering Semiconductor Technologies

Introduction

Ulrich Mantz, a distinguished inventor based in Dresden, Germany, has made significant contributions to the field of semiconductor technology. With a portfolio of nine patents, his inventive work focuses on enhancing measurement techniques within semiconductor devices. His innovations have advanced how measurements are performed, thereby facilitating better performance and accuracy in semiconductor manufacturing.

Latest Patents

Mantz's latest patents showcase his innovative approach to semiconductor measurements. One notable patent involves "Targets for measurements in semiconductor devices." This invention addresses the challenge of long lines in measurement structures that exceed design rule limitations. By dividing these lines into segments, one embodiment introduces a periodic structure, while another eliminates periodicity by staggering segments of equal lengths in adjacent lines. These advancements allow for improved measurement capabilities within semiconductor wafer regions.

Another of his prominent inventions is a "Method and apparatus for measuring a surface profile of a sample." This patent details a technique for producing an imprint of a surface profile using a deformable transfer material that can be cured under specific conditions. Notably, this process applies to processed semiconductor materials, including patterned semiconductor wafers. The method enhances measurement accuracy by allowing the imprint size to match or be smaller than the original surface profile.

Career Highlights

Ulrich Mantz has held significant positions in various esteemed companies, including Infineon Technologies and Siemens Aktiengesellschaft. His work in these organizations has allowed him to apply his inventive skills to real-world challenges in the semiconductor industry. His dedication to research and development has played a crucial role in propelling technological advancements.

Collaborations

Throughout his career, Mantz has collaborated with notable professionals, including Alexander Michaelis and Oliver Genz. These collaborations have fostered a dynamic exchange of ideas, contributing to the continued growth and development of innovative technologies in the semiconductor field.

Conclusion

Ulrich Mantz stands out as a leading inventor whose work in semiconductor technology has paved the way for innovative measurement techniques. His extensive patent portfolio reflects his commitment to advancing the industry, making significant strides that benefit semiconductor manufacturing processes. As technologies evolve, Mantz’s contributions will undoubtedly continue to influence the field, ensuring precision and efficiency in semiconductor device fabrication.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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