Kaohsiung, Taiwan

Tzu Chan Weng

This inventor holds 1 USPTO granted patent and 2 published patent applications. Top assignee: Taiwan Semiconductor Manufacturing Comp. Ltd.. Active years: 2011.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Tzu Chan Weng. Retrieved from https://idiyas.com/inventor/tzu-chan-weng-ca8ou9rq

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank
USPTO Granted Patents = 1 

Average Co-Inventor Count = 7.0

ph-index = 1


Company Filing History:


Years Active: 2011

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1 patent (USPTO):Explore Patents

Title: Tzu Chan Weng: A Pioneer in Dimensional Measurement Technology

Introduction

Tzu Chan Weng, an innovative inventor based in Kaohsiung, Taiwan, has made significant contributions in the field of dimensional measurement technology. His sole patent showcases an advanced method for measuring dimensional characteristics, leveraging intricate techniques in reflective and dielectric layers to enhance accuracy in measurements.

Latest Patents

Weng's patent, titled "Feature Dimension Measurement," details a comprehensive approach to quantify dimensional characteristics. The method includes the formation of a substrate and a reflective layer, followed by a dielectric layer embedded with a grating pattern. By directing radiation onto this configuration, Weng’s technique enables the precise determination of dimensional information via the analysis of radiation patterns reflected and scattered by the metal grating. The integration of a resistivity test line allows for dual-dimensional measurement, where both the reflected radiation and resistance values are compared to yield accurate results.

Career Highlights

Tzu Chan Weng is currently affiliated with Taiwan Semiconductor Manufacturing Company Ltd., a leading entity in the semiconductor industry. His groundbreaking work in feature dimension measurement has positioned him as a key figure in advancing the technology used in semiconductor fabrication and quality control.

Collaborations

Throughout his career, Weng has collaborated with esteemed colleagues like Ching-Chung Su and Yi-Wei Chiu, both of whom contribute to the innovative environment at Taiwan Semiconductor Manufacturing Company Ltd. Their combined expertise fosters a collaborative spirit that enhances research and development in the field of measurement technologies.

Conclusion

With only one patent under his name, Tzu Chan Weng continues to exemplify the spirit of innovation in measuring technologies. His contributions not only advance the capabilities of dimensional measurement but also signal the importance of precision in the rapidly evolving semiconductor industry. As he progresses in his career, Weng remains a notable figure whose work is set to influence future advancements in engineering and technology.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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