Hitachinaka, Japan

Tsuyoshi Onishi


Average Co-Inventor Count = 3.4

ph-index = 2

Forward Citations = 14(Granted Patents)


Location History:

  • Tokyo, JP (2015)
  • Hitachinaka, JP (2013 - 2019)

Company Filing History:


Years Active: 2013-2019

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7 patents (USPTO):Explore Patents

Title: Tsuyoshi Onishi: Innovator in Charged Particle Beam Technology

Introduction

Tsuyoshi Onishi is a prominent inventor based in Hitachinaka, Japan. He has made significant contributions to the field of charged particle beam technology, holding a total of 7 patents. His work focuses on enhancing the precision and efficiency of ion beam fabrication processes.

Latest Patents

Onishi's latest patents include a "Charged Particle Beam Device and Sample Production Method." This invention provides a technique capable of removing a damaged layer of a sample piece generated through focused ion beam (FIB) fabrication while minimizing material loss. The device features a first element ion beam optical system unit that performs initial FIB fabrication, and a second element ion beam optical system unit that removes the damaged layer. The termination of the second FIB fabrication is determined based on the concentration of a specific element in the damaged layer.

Another notable patent is the "Apparatus and Method for Probe Shape Processing by Ion Beam." This invention allows for the preparation of standardized probes without requiring advanced skills in probe processing. The method includes several processes, such as detecting the probe shape based on incoming current, extracting the probe tip position, and generating a processing pattern for ion-beam processing.

Career Highlights

Tsuyoshi Onishi is affiliated with Hitachi High-Technologies Corporation, where he continues to innovate in the field of charged particle beam technology. His work has significantly advanced the capabilities of ion beam applications in various industries.

Collaborations

Onishi collaborates with notable colleagues, including Satoshi Tomimatsu and Shinya Kitayama. Their combined expertise contributes to the development of cutting-edge technologies in their field.

Conclusion

Tsuyoshi Onishi's contributions to charged particle beam technology exemplify the innovative spirit of modern inventors. His patents reflect a commitment to improving fabrication processes and advancing scientific research.

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