Company Filing History:

16 out of 42,496

Hitachi, Ltd.

patents

9 out of 2,874

Hitachi-high-technologies Corporation

patents

2 out of 832,843

Other

patents

Years Active: 1990-2014

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27 patents (USPTO):Sort by Forward CitationsExplore Patents

1. 8686360 - Micro-sample processing method, observation method and apparatus (2014-04-01),

2. 8455824 - Charged particle beam apparatus, and sample processing and observation method (2013-06-04),

3. 7928377 - Charged particle beam apparatus and sample manufacturing method (2011-04-19),

4. 7915581 - Methods for sample preparation and observation, charged particle apparatus (2011-03-29),

5. 7902505 - Charged particle beam apparatus (2011-03-08),

6. 7872230 - Micro-sample processing method, observation method and apparatus (2011-01-18),

7. 7612337 - Focused ion beam system and a method of sample preparation and observation (2009-11-03),

8. 7482586 - Methods for sample preparation and observation, charged particle apparatus (2009-01-27),

9. 7442928 - Charged particle beam apparatus (2008-10-28),

10. 6839200 - Combination perpendicular magnetic head having shield material formed at both ends of an upper pole of a write element (2005-01-04),

11. 6665141 - Magnetic head having track width defined by trench portions filled with magnetic shield material (2003-12-16),

12. 6538844 - Method of fabricating a magnetic head by focused ion beam etching (2003-03-25),

13. 6521890 - Focused ion beam machining method and focused ion beam machining apparatus (2003-02-18),

14. 6310341 - Projecting type charged particle microscope and projecting type substrate inspection system (2001-10-30),

15. 6307707 - Narrow track thin film head including magnetic poles machined by focused ion beam etching (2001-10-23),

Title: Exploring the Innovations of Tsuyoshi Ohnishi: A Pioneer in Micro-Sample Processing

Introduction: Tsuyoshi Ohnishi, based in Hitachinaka, Japan, is a prominent inventor with an impressive portfolio of 27 patents. His innovations primarily focus on advanced methods for processing and observing microscopic samples, addressing significant challenges faced in the field.

Latest Patents: Among his latest contributions are two noteworthy patents: the "Micro-sample processing method, observation method and apparatus" and the "Charged particle beam apparatus, and sample processing and observation method." The former tackles the intricacies of processing thin films susceptible to electron beam irradiation, enhancing positional accuracy and minimizing damage. It introduces a method to visually capture cross-sectional structures without relying on electron beams, thus preventing additional harm to delicate samples. The latter patent allows for the efficient monitoring and processing of samples via charged particle beams, ensuring that specific regions are accurately targeted and processed, even when their dimensions and locations are initially uncertain.

Career Highlights: Ohnishi's career has been marked by his tenure at notable companies including Hitachi, Ltd. and Hitachi High-Technologies Corporation. His work in these organizations has significantly propelled advancements in micro-sample technology, making him a respected figure in the innovation community.

Collaborations: Throughout his career, Ohnishi has collaborated with established professionals in the field, including Tohru Ishitani and Hideo Todokoro. Such partnerships exemplify his commitment to fostering innovation through teamwork and knowledge sharing.

Conclusion: Tsuyoshi Ohnishi's contributions to micro-sample processing stand as a testament to his ingenuity and dedication to technological advancement. His patents not only solve critical problems but also pave the way for future innovations in the field, demonstrating the vital impact of collaborative efforts in scientific research and technology development.

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