Company Filing History:

13 out of 42,517

Hitachi, Ltd.

patents

3 out of 2,874

Hitachi-High-Technologies Corporation

patents

where one patent can have more than one assignee

Years Active: 1989-2007

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15 patents (USPTO):Sort by Forward CitationsExplore Patents

1. 7186973 - Ion trap/time-of-flight mass analyzing apparatus and mass analyzing method (2007-03-06),

2. 7161141 - Ion trap/time-of-flight mass spectrometer and method of measuring ion accurate mass (2007-01-09),

3. 6914239 - System for analyzing mass spectrometric data (2005-07-05),

4. 6248998 - Plasma ion source mass spectrometer (2001-06-19),

5. 5793039 - Mass spectrometer, skimmer cone assembly, skimmer cone and its (1998-08-11),

6. 5763877 - Analyzer using plasma and analysis method using plasma, interface used (1998-06-09),

7. 5616918 - Plasma ion mass spectrometer and plasma mass spectrometry using the same (1997-04-01),

8. 5308977 - Plasma mass spectrometer (1994-05-03),

9. 5252827 - Method and apparatus for analysis of gases using plasma (1993-10-12),

10. 5202562 - High sensitive element analyzing method and apparatus of the same (1993-04-13),

11. 5108178 - Atomic absorption spectrophotometer and electromagnetic shut-off valve (1992-04-28),

12. 5104220 - Atomic absorption spectrophotometer and analyzing method (1992-04-14),

13. 4890919 - Atomic absorption spectrophotometer (1990-01-02),

14. 4867562 - Atomic absorption spectrophotometer (1989-09-19),

15. 4840484 - Atomic absorption spectrophotometer with furnace at pressure equal or (1989-06-20),

Title: Toyoharu Okumoto: Innovator in Mass Spectrometry

Introduction

Toyoharu Okumoto is a distinguished inventor based in Hitachinaka, Japan. He has made significant contributions to the field of mass spectrometry, holding a total of 15 patents. His innovative work has advanced the capabilities of ion trap and time-of-flight mass analyzing technologies.

Latest Patents

Okumoto's latest patents include an "Ion trap/time-of-flight mass analyzing apparatus and mass analyzing method." This invention features an ion trap-TOF/MS that can calibrate the observed mass for each of an ion trap and a TOF. In this system, sample ions with known mass numbers are trapped within an ion trap, and auxiliary AC voltages are applied to expel unwanted ions. The measurement process involves applying DC voltages to expel an ion remaining within the ion trap and measuring its mass number using a time-of-flight mass spectrometer. This calibration process enhances the accuracy of mass measurements.

Another notable patent is the "Ion trap/time-of-flight mass spectrometer and method of measuring ion accurate mass." This device performs accurate mass measurements of product ions based on MS/MS techniques. It includes an ion source for ionizing samples, an ion trap for temporarily trapping ions, and a time-of-flight mass spectrometer. The system allows for the selection and fragmentation of precursor ions, leading to the production of product ions that are then analyzed for mass spectrum data.

Career Highlights

Throughout his career, Okumoto has worked with prominent companies such as Hitachi, Ltd. and Hitachi High-Technologies Corporation. His experience in these organizations has contributed to his expertise in mass spectrometry and related technologies.

Collaborations

Okumoto has collaborated with notable colleagues, including Konosuke Oishi and Masamichi Tsukada. These partnerships have fostered innovation and development in the field of mass spectrometry.

Conclusion

Toyoharu Okumoto's contributions to mass spectrometry through his patents and collaborations highlight his role as a leading inventor in this specialized field. His work continues to influence advancements in analytical technologies.

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